SPIE AR/VR

At SPIE AR/VR 2026 at our booth #6417 we will showcase our latest solutions for metrology of near-eye display (NED) headsets, including:
▶️ LMK 6 Imaging light and color measuring devices
▶️ NED metrology optics for absolute, precise, compact and efficient NED headset measurement and characterization
▶️LED-RIGO Microdisplay characterization, Measurement of ray-files and angular intensity profiles as well as spectral distributions 
Our systems enable reliable evaluation of key visual performance parameters and are well suited for both R&D and production environments.

We also invite you to attend our presentation "Compact metrology for AR projectors and AR devices" on 19 January 2026 • 9:20 AM - 9:40 AM PST | Room 2010 (Moscone West, Level 2)
Link: Compact-metrology-for-AR-projectors-and-AR-devices